Transmission electron microscopy characterization of CrN films on MgO(001)

Harzer, T. P., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2013, In: Thin solid films. 545, p. 154-160 7 p.

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Patterned immobilisation of silicon dioxide nanoparticles on the surface of a photosensitive polymer

Muhr, N., Kern, W. & Grießer, T., 2012, In: Thin solid films. 520, p. 1789-1793

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Self-assembling (nano-)wrinkling topography formation in low-temperature vacuum deposition on soft polymer surfaces

Lackner, J., Waldhauser, W., Hartmann, P., Miskovics, O., Schmied, F., Teichert, C. & Schöberl, T., 2012, In: Thin solid films. 520, p. 2833-2840

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Influence of Zr on structure, mechanical and thermal properties of Ti-Al-N

Chen, L., Holec, D., Du, Y. & Mayrhofer, P. H., 2011, In: Thin solid films. 519, p. 5503-5510

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Oxidation and diffusion study on AlCrVN hard coatings using oxygen isotopes 16O and 18O

Franz, R., Schnöller, J., Hutter, H. & Mitterer, C., 2011, In: Thin solid films. 519, p. 3974-3981

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Low Friction CrN/TiN multilayer coatings prepared by a hybrid high power impulse magnetron sputtering/DC magnetron sputtering deposition technique

Paulitsch, J., Schenkel, M., Schintlmeister, A., Hutter, H. & Mayrhofer, P. H., 2010, In: Thin solid films. 518, p. 5553-5557

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Micron-sized fracture experiments on amorphous SiOx films and SiOx/SiNx multi-layers

Matoy, K., Schönherr, H., Detzel, T. & Dehm, G., 2010, In: Thin solid films. 518, p. 5796-5801

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Morphology characterization and friction coefficient determination of sputtered V2O5 films

Klünsner, T., Shen, Q., Hlawacek, G., Teichert, C., Fateh, N., Fontalvo, G. & Mitterer, C., 2010, In: Thin solid films. 519, p. 1416-1420

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Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction

Kirchlechner, C., Martinschitz, K. J., Daniel, R., Klaus, M., Genzel, C., Mitterer, C. & Keckes, J., 2010, In: Thin solid films. 518, 8, p. 2090-2096

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Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM

Cazottes, S., Zhang, Z. L., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films.

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Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM

Cazottes, S., Zhang, Z., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films. 519, p. 1662-1667

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Structure and properties of high power impulse magnetron sputtering and DC magnetron sputtering CrN and TiN films deposited in an industrial scale unit

Paulitsch, J., Schenkel, M., Zufraß, T., Mayrhofer, P. H. & Münz, W.-D., 2010, In: Thin solid films. 518, p. 5558-5564

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Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films

Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, In: Thin solid films. 518, p. 7075-7080

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A comparative micro-cantilever study of the mechanical behavior of silicon based passivation films

Matoy, K., Schönherr, H., Detzel, T., Schöberl, T., Pippan, R., Motz, C. & Dehm, G., 2009, In: Thin solid films. 518, p. 247-256

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Can micro-compression testing provide stress-strain data for thin films? A comparative study using Cu, VN, TiN and W coatings

Dehm, G., Wörgötter, H.-P., Cazottes, S., Purswani, J. M., Gall, D., Mitterer, C. & Kiener, D., 2009, In: Thin solid films. 518, p. 1517-1521

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Compositional and structural evolution of sputtered Ti-Al-N

Chen, L., Moser, M., Du, Y. & Mayrhofer, P. H., 2009, In: Thin solid films. p. 6635-6641

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Structural and mechanical properties of diamond-like carbon films deposited by an anode layer source

Kahn, M., Cekada, M., Schoeberl, T., Berghauser, R., Mitterer, C., Bauer, C., Waldhauser, W. & Brandstätter, E., 2009, In: Thin solid films. 517, p. 6502-6507

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Epitaxial growth of Al-Cr-N thin films on MgO (111)

Willmann, H., Beckers, M., Birch, J., Mayrhofer, P. H., Mitterer, C. & Hultman, L., 2008, In: Thin solid films. p. 598-602

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Interface structure of epitaxial (111) VN films on (111) MgO substrates

Lazar, P., Rashkova, B., Redinger, J., Podloucky, R., Mitterer, C., Scheu, C. & Dehm, G., 2008, In: Thin solid films. 517, p. 1177-1181

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Intrinsic stresses and stress relaxation in TiN/Ag multilayer coatings during thermal cycling

Köstenbauer, H., Fontalvo, G., Keckes, J. & Mitterer, C., 2008, In: Thin solid films. 516, p. 1920-1924

Research output: Contribution to journal › Article › Research › peer-review