Can micro-compression testing provide stress-strain data for thin films? A comparative study using Cu, VN, TiN and W coatings

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Authors

  • Hans-Peter Wörgötter
  • Sophie Cazottes
  • Jaya M. Purswani
  • Daniel Gall

Organisational units

Details

Translated title of the contributionCan micro-compression testing provide stress-strain data for thin films?: A comparative study using Cu, VN, TiN and W coatings
Original languageEnglish
Pages (from-to)1517-1521
JournalThin solid films
Volume518
DOIs
Publication statusPublished - 2009