Microstructure and stress gradients in TiW thin films characterized by 40 nm X-ray diffraction and transmission electron microscopy

Saghaeian, F., Keckes, J., Woehlert, S., Rosenthal, M., Reisinger, M. & Todt, J., 14 Okt. 2019, (Elektronische Veröffentlichung vor Drucklegung.) in: Thin solid films. 691.2019, 1 December, 7 S., 137576.

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Thermal expansion of magnetron sputtered TiC_xN_1-x coatings studied by high-temperature X-ray diffraction

Saringer, C., Kickinger, C., Munnik, F., Mitterer, C., Schalk, N. & Tkadletz, M., 31 Okt. 2019, in: Thin solid films. 688.2019, 31 October, 8 S., 137307.

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Extracting high-temperature stress–strain curves from a 1.2 μm silicon film using spherical nanoindentation

Schaffar, G. J. K., Tscharnuter, D., Imrich, P. J. & Maier-Kiener, V., 27 Dez. 2024, in: Thin solid films. 809.2025, 1 January, 10 S., 140597.

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Influence of CrN and AlN layer thicknesses on structure and mechanical properties of CrN/AlN superlattices

Schlögl, M., Mayer, B., Paulitsch, J. & Mayrhofer, P., 2013, in: Thin solid films. 545, S. 375-379

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Influence of AlN layers on mechanical properties and thermal stability of Cr-based nitride coatings

Schlögl, M., Paulitsch, J., Keckes, J. & Mayrhofer, P. H., 2013, in: Thin solid films. 531, S. 113-118

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Critical assessment of the determination of residual stress profiles in thin films by means of the ion beam layer removal method

Schöngrundner, R., Treml, R., Antretter, T., Kozic, D., Ecker, W. & Kiener, D., 2014, in: Thin solid films. S. 321-330

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Mechanical properties of homogeneous and nitrogen graded TiN thin films

Silva, F. C., Tunes, M. A., Sagás, J. C., Fontana, L. C., de Lima, N. B. & Schön, C. G., 30 Sept. 2020, in: Thin solid films. 710, S. 138268 1 S., 138268.

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Microstructure and physical properties of sputter-deposited Cu-Mo thin films

Souli, I., Terziyska, V., Zechner, J. & Mitterer, C., 2018, in: Thin solid films. S. 301-308

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Influence of Al and Si content on structure and mechanical properties of arc evaporated Al-Cr-Si-N thin films

Tritremmel, C., Daniel, R., Lechthaler, M., Pocik, P. & Mitterer, C., 2013, in: Thin solid films. 534, S. 403-409

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