Neuester Forschungsoutput

• Combined X-ray microdiffraction and micromechanical testing for direct measurement of thin film elastic constants

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

• 20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

• Resolving the fundamentals of the J-integral concept by multi-method in situ nanoscale stress-strain mapping

  Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)