Research output

  1. 2024
  2. Published
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    Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning

    Holub, G., Hofer, S., Obermüller, T. & Romaner, L., 2024.

    Research output: Contribution to conferencePosterResearchpeer-review

  6. Published
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