Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning

Research output: Contribution to conference › Poster › Research › peer-review

Authors

Original language	English
Publication status	Published - 2024
Event	International Conference on Silicon Carbide and Related Materials (ICSCRM 2024) - North Carolina, United States Duration: 29 Sept 2024 → 4 Oct 2024

Conference	International Conference on Silicon Carbide and Related Materials (ICSCRM 2024)
Country/Territory	United States
City	North Carolina
Period	29/09/24 → 4/10/24