Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation

Research output: Contribution to conferencePosterResearch

Authors

External Organisational units

  • EEMCO GmbH

Details

Original languageEnglish
Publication statusPublished - 2023
EventAIMSE 2023 - Saarbrücken, Germany
Duration: 22 Nov 202323 Nov 2023

Conference

ConferenceAIMSE 2023
Country/TerritoryGermany
CitySaarbrücken
Period22/11/2323/11/23