Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation
Research output: Contribution to conference › Poster › Research
Standard
Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation. / Holub, Georg; Hofer, Sebastian; Obermüller, T. et al.
2023. Poster session presented at AIMSE 2023, Saarbrücken, Germany.
2023. Poster session presented at AIMSE 2023, Saarbrücken, Germany.
Research output: Contribution to conference › Poster › Research
Harvard
Holub, G, Hofer, S, Obermüller, T & Romaner, L 2023, 'Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation', AIMSE 2023, Saarbrücken, Germany, 22/11/23 - 23/11/23.
APA
Holub, G., Hofer, S., Obermüller, T., & Romaner, L. (2023). Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation. Poster session presented at AIMSE 2023, Saarbrücken, Germany.
Vancouver
Holub G, Hofer S, Obermüller T, Romaner L. Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation. 2023. Poster session presented at AIMSE 2023, Saarbrücken, Germany.
Author
Bibtex - Download
@conference{c6a3564a1042466ea440a0da6d643603,
title = "Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation",
author = "Georg Holub and Sebastian Hofer and T. Oberm{\"u}ller and Lorenz Romaner",
year = "2023",
language = "English",
note = "AIMSE 2023 ; Conference date: 22-11-2023 Through 23-11-2023",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation
AU - Holub, Georg
AU - Hofer, Sebastian
AU - Obermüller, T.
AU - Romaner, Lorenz
PY - 2023
Y1 - 2023
M3 - Poster
T2 - AIMSE 2023
Y2 - 22 November 2023 through 23 November 2023
ER -
