Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning. / Holub, Georg; Hofer, Sebastian; Obermüller, Thomas et al.
2024. Poster session presented at International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, United States.
2024. Poster session presented at International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, United States.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Holub, G, Hofer, S, Obermüller, T & Romaner, L 2024, 'Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning', International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, United States, 29/09/24 - 4/10/24.
APA
Holub, G., Hofer, S., Obermüller, T., & Romaner, L. (2024). Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning. Poster session presented at International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, United States.
Vancouver
Holub G, Hofer S, Obermüller T, Romaner L. Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning. 2024. Poster session presented at International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, United States.
Author
Bibtex - Download
@conference{c355f5ad44994a839a636b5f882c1042,
title = "Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning",
author = "Georg Holub and Sebastian Hofer and Thomas Oberm{\"u}ller and Lorenz Romaner",
year = "2024",
language = "English",
note = "International Conference on Silicon Carbide and Related Materials (ICSCRM 2024) ; Conference date: 29-09-2024 Through 04-10-2024",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning
AU - Holub, Georg
AU - Hofer, Sebastian
AU - Obermüller, Thomas
AU - Romaner, Lorenz
PY - 2024
Y1 - 2024
M3 - Poster
T2 - International Conference on Silicon Carbide and Related Materials (ICSCRM 2024)
Y2 - 29 September 2024 through 4 October 2024
ER -
