Karl Christian Teichert
Research output
- 2010
- Published
AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2
Kratzer, M., Klima, S., Beinik, I., Shen, Q., Lugstein, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
AFM-Untersuchungen zufallsrauher Polymeroberflächen
Miskovic, O., Schmied, F. & Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems
Weber, A., Resch, K. & Teichert, C., 2010, 10th Austrian Polymer Meeting and 2nd Joint Austrian-Slovenian Polymer Meeting. p. 64-67Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Atomic force microscopy studies on the morphology of polymeric thermotropic glazings for overheating protection applications
Weber, A., Resch, K. & Teichert, C., 2010, Polymeric Materials 2010. p. 0-0Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
C-AFM and FFM measurements of tribological samples
Shen, Q. & Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Characterization of Kraft Pulp Fiber Surfaces using Higher Harmonic Atomic Force Microscopy
Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Combined C-AFM/PFM investigations of ZnO nanorods
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
Schloffer, M., Teichert, C., Supancic, P., Andreev, A., Hou, Y. & Wang, Z., 2010, In: Journal of the European Ceramic Society. 30, p. 1761-1764Research output: Contribution to journal › Article › Research › peer-review
