Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

Research output: Contribution to conferencePosterResearchpeer-review

Authors

  • B. Galiana
  • I. Rey-Stolle
  • C. Algora
  • Paloma Tejedor

Organisational units

Details

Translated title of the contributionComplementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Original languageEnglish
Publication statusPublished - 2010
Event16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010" - Mauterndorf, Austria
Duration: 22 Feb 201026 Feb 2010

Conference

Conference16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010"
Country/TerritoryAustria
CityMauterndorf
Period22/02/1026/02/10