AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2
Research output: Contribution to conference › Poster › Research › peer-review
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Details
| Translated title of the contribution | AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2 |
|---|---|
| Original language | German |
| Publication status | Published - 2010 |
| Event | ÖPG 2010 - Salzburg, Austria Duration: 6 Sept 2010 → 10 Sept 2010 |
Conference
| Conference | ÖPG 2010 |
|---|---|
| Abbreviated title | ÖPG 2010 |
| Country/Territory | Austria |
| City | Salzburg |
| Period | 6/09/10 → 10/09/10 |
