Karl Christian Teichert
501 - 506 out of 506Page size: 10
Research output
- 2003
- Published
Modification and characterization of thin silicon gate oxides using conducting atomic force microscopy
Kremmer, S., Peissl, S., Teichert, C., Kuchar, F. & Hofer, C., 2003, In: Materials science and engineering B (Solid-state materials for advanced technology). 102, p. 88-93Research output: Contribution to journal › Article › Research › peer-review
- Published
Molecular alignments in sexiphenyl thin films epitaxially grown on muscovite
Plank, H., Resel, R., Sitter, H., Andreev, A., Sariciftci, N. S., Hlawacek, G., Teichert, C., Thierry, A. & Lotz, B., 2003, In: Thin solid films. 443, p. 108-114Research output: Contribution to journal › Article › Research › peer-review
- 2002
- Published
35th IUVSTA Workshop “Pattern Formation and Atomic Processes in Epitaxial Growth and Ion Erosion”
Teichert, C. (ed.), 2002, Eigenverlag.Research output: Book/Report › Anthology › Research
- Published
Characterization of silicon gate oxides by conducting atomic-force microscopy
Kremmer, S., Teichert, C., Pischler, E., Gold, H., Kuchar, F. & Schatzmayr, M., 2002, In: Surface and interface analysis. 33, p. 168-172Research output: Contribution to journal › Article › Research › peer-review
- 2000
- Published
Pattern formation in PbTe multilayer films
Teichert, C., Jamnig, B. D. & Oswald, J., 2000, In: Surface Science. p. 823-826Research output: Contribution to journal › Article › Research › peer-review
- 1999
- Published
Ferromagnetic data store free from problems of relative positioning of a read-write device with a storage device
Teichert, C., 30 Sept 1999Research output: Patent
