Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems
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| Translated title of the contribution | Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems |
|---|---|
| Original language | English |
| Title of host publication | 10th Austrian Polymer Meeting and 2nd Joint Austrian-Slovenian Polymer Meeting |
| Pages | 64-67 |
| Publication status | Published - 2010 |
