Karl Christian Teichert
Research output
- 2012
- Published
Utilizing atomic force microscopy to characterize various single fiber-fiber bonds
Schmied, F., Ganser, C., Fischer, W., Hirn, U., Bauer, W., Schennach, R. & Teichert, C., 2012, Utilizing atomic force microscopy to characterize various single fiber-fiber bonds. p. 141-143Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Wzrost molekul para-sexiphenylu na zmodykowanej wiazka jonowa powierzchni TiO2 (110)
Wrana, D., Kratzer, M., Teichert, C. & Krok, F., 2012.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Ätzstudien und KPFM korrelation auf ZnO-Varistoren
Nevosad, A. & Teichert, C., 2012Research output: Book/Report › Commissioned report › Transfer › peer-review
- 2011
- Published
AFM Based Investigations of ZnO Varistor Ceramics
Pavitschitz, A., Hofstätter, M., Supancic, P., Athenstaedt, W., Auer, C. & Teichert, C., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Annealing of Para-Sexiphenyl on Silicon Dioxide Surfaces.
Lorbek, S., Shen, Q. & Teichert, C., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
C-AFM auf ZnO Varistoren
Pavitschitz, A. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Carrier transfer effect on transport in p-i-n structures with Ge quantum dots
Lysenko, V. S., Gomeniuk, Y. V., Strelchuk, V. V., Nikolenko, A. S., Kondratenko, S. V., Kozyrev, Y. N., Rubezhanska, M. Y. & Teichert, C., 2011, In: Physical review : B, Condensed matter and materials physics. 84, p. 115425-1-15425-9Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
Galiana, B., Rey-Stolle, I., Beinik, I., Teichert, C., Algora, C., Molina-Aldareguia, J. M. & Tejedor, P., 2011, In: Solar energy materials and solar cells. 95, p. 1949-1954Research output: Contribution to journal › Article › Research › peer-review
- Published
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Contact angle and AFM roughness measurements of polymer coated steel samples
Lugger, M. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
