Igor Beinik

(Former)

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Research output

  1. 2011
  2. Published

    Testmessungen mittels Leitfähigkeitsrasterkraftmikroskopie an 30 µm x 1600µm

    Beinik, I. & Teichert, C., 2011

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  3. 2010
  4. Published

    AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2

    Kratzer, M., Klima, S., Beinik, I., Shen, Q., Lugstein, A. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Combined C-AFM/PFM investigations of ZnO nanorods

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

    Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  8. Published

    Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

    Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Scanning Probe Microscopy-based Characterization of ZnO Nanorods

    Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W. & Brauer, G., 2010, Abstract CD IEEE International NanoElectronics Conference (INEC 2010). p. 438-439

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  10. Published

    Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films

    Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, In: Thin solid films. 518, p. 7075-7080

    Research output: Contribution to journal › Article › Research › peer-review

  11. 2009
  12. Published

    Application of conductive AFM technique to measure electrical conductance of tribofilms

    Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009, Proceedings of 26th Danubia-Adria Symposium on Advances in Experimental Mechanics. p. 205-206

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  13. Published

    Application of conductive AFM technique to measure electrical conductance of tribofilms

    Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

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