Scanning Probe Microscopy-based Characterization of ZnO Nanorods
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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| Translated title of the contribution | Scanning Probe Microscopy-based Characterization of ZnO Nanorods |
|---|---|
| Original language | English |
| Title of host publication | Abstract CD IEEE International NanoElectronics Conference (INEC 2010) |
| Pages | 438-439 |
| Publication status | Published - 2010 |
