Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
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| Translated title of the contribution | Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge |
|---|---|
| Original language | English |
| Pages (from-to) | C5G5-C5G10 |
| Journal | Journal of vacuum science & technology / B (JVST) |
| Volume | 28 |
| DOIs | |
| Publication status | Published - 2010 |
