Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Research output: Contribution to journal › Article › Research › peer-review
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Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge. / Beinik, Igor; Galiana, B.; Kratzer, Markus et al.
In: Journal of vacuum science & technology / B (JVST), Vol. 28, 2010, p. C5G5-C5G10.
In: Journal of vacuum science & technology / B (JVST), Vol. 28, 2010, p. C5G5-C5G10.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Beinik, I, Galiana, B, Kratzer, M, Teichert, C, Rey-Stolle, I, Algora, C & Tejedor, P 2010, 'Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge', Journal of vacuum science & technology / B (JVST), vol. 28, pp. C5G5-C5G10. https://doi.org/10.1116/1.3454373
APA
Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C., & Tejedor, P. (2010). Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge. Journal of vacuum science & technology / B (JVST), 28, C5G5-C5G10. https://doi.org/10.1116/1.3454373
Vancouver
Beinik I, Galiana B, Kratzer M, Teichert C, Rey-Stolle I, Algora C et al. Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge. Journal of vacuum science & technology / B (JVST). 2010;28:C5G5-C5G10. doi: 10.1116/1.3454373
Author
Bibtex - Download
@article{d18e2a16e7cb4e309b1c8c58ed735e41,
title = "Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge",
author = "Igor Beinik and B. Galiana and Markus Kratzer and Christian Teichert and I. Rey-Stolle and C. Algora and Paloma Tejedor",
year = "2010",
doi = "10.1116/1.3454373",
language = "English",
volume = "28",
pages = "C5G5--C5G10",
journal = "Journal of vacuum science & technology / B (JVST)",
issn = "0734-211X",
publisher = "AVS Science and Technology Society",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
AU - Beinik, Igor
AU - Galiana, B.
AU - Kratzer, Markus
AU - Teichert, Christian
AU - Rey-Stolle, I.
AU - Algora, C.
AU - Tejedor, Paloma
PY - 2010
Y1 - 2010
U2 - 10.1116/1.3454373
DO - 10.1116/1.3454373
M3 - Article
VL - 28
SP - C5G5-C5G10
JO - Journal of vacuum science & technology / B (JVST)
JF - Journal of vacuum science & technology / B (JVST)
SN - 0734-211X
ER -
