Igor Beinik

(Former)

1 - 20 out of 28Page size: 20

Research output

  1. 2013
  2. Published

    Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Piryatinski, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F., Djurišić, A. B. & Teichert, C., 17 Apr 2013, In: Beilstein journal of nanotechnology. 4, 1, p. 208-217 10 p.

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Photoresponse from single upright standing ZnO nanorods explored by photoconductive atomic force microscopy

    Beinik, I., Kratzer, M., Teichert, C., Wachauer, A., Wang, L., Pyriatinsky, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurisic, A., 2013, In: Beilstein journal of nanotechnology . 4, p. 208-217

    Research output: Contribution to journal › Article › Research › peer-review

  4. 2012
  5. Published

    Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurišić, A. B., 1 Oct 2012, In: Journal of applied physics. 112.2012, 7, 1 p., 079903.

    Research output: Contribution to journal › Comment/debate › peer-review

  6. Published

    Electrical and photovoltaic properties of self assembled Ge nanodomes on Si(001)

    Kratzer, M., Prehal, C., Rubezhanska, M., Beinik, I., Kondratenko, S., Kozyrev, Y. & Teichert, C., 2012, In: Physical review : B, Condensed matter and materials physics. 86, p. 245320-1-245320-7

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    Ion beam irradiation of cuprate high-temperature superconductors: Systematic modification of the electrical properties and fabrication of nanopatterns

    Lang, W., Marksteiner, M., Bodea, M. A., Siraj, K., Pedarnig, J. D., Kolarova, R., Bauer, P., Hasengrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2012, In: Nuclear instruments & methods in physics research / B Beam interactions with materials and atoms. 272, p. 300-304

    Research output: Contribution to journal › Article › Research › peer-review

  8. 2011
  9. Published

    Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications

    Galiana, B., Rey-Stolle, I., Beinik, I., Teichert, C., Algora, C., Molina-Aldareguia, J. M. & Tejedor, P., 2011, In: Solar energy materials and solar cells. 95, p. 1949-1954

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics

    Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

  11. Published

    Electrical Characterization of Semiconductor Nanostructures by Conductive Probe Based Atomic Force Microscopy Techniques

    Beinik, I., 2011, 118 p.

    Research output: Thesis › Doctoral Thesis

  12. Published

    Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7

    Research output: Contribution to journal › Article › Research › peer-review

  13. Published

    Electrical Transport of Single ZnO Nanorods studied by Photo- Conductive AFM

    Kratzer, M., Beinik, I., Teichert, C., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011.

    Research output: Contribution to conference › Poster › Research › peer-review

  14. Published

    Testmessungen mittels Leitfähigkeitsrasterkraftmikroskopie an 30 µm x 1600µm

    Beinik, I. & Teichert, C., 2011

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  15. 2010
  16. Published

    AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2

    Kratzer, M., Klima, S., Beinik, I., Shen, Q., Lugstein, A. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  17. Published

    Combined C-AFM/PFM investigations of ZnO nanorods

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  18. Published

    Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

    Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  19. Published

    Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  20. Published

    Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

    Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10

    Research output: Contribution to journal › Article › Research › peer-review

  21. Published

    Scanning Probe Microscopy-based Characterization of ZnO Nanorods

    Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W. & Brauer, G., 2010, Abstract CD IEEE International NanoElectronics Conference (INEC 2010). p. 438-439

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  22. Published

    Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films

    Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, In: Thin solid films. 518, p. 7075-7080

    Research output: Contribution to journal › Article › Research › peer-review

  23. 2009
  24. Published

    Application of conductive AFM technique to measure electrical conductance of tribofilms

    Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009, Proceedings of 26th Danubia-Adria Symposium on Advances in Experimental Mechanics. p. 205-206

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  25. Published

    Application of conductive AFM technique to measure electrical conductance of tribofilms

    Pondicherry, K., Beinik, I., Grün, F., Godor, I. & Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

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