Igor Beinik

(Former)

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Research output

  1. 2010
  2. Published

    AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2

    Kratzer, M., Klima, S., Beinik, I., Shen, Q., Lugstein, A. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  3. Published

    Combined C-AFM/PFM investigations of ZnO nanorods

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

    Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

    Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    Scanning Probe Microscopy-based Characterization of ZnO Nanorods

    Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W. & Brauer, G., 2010, Abstract CD IEEE International NanoElectronics Conference (INEC 2010). p. 438-439

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  8. Published

    Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films

    Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, In: Thin solid films. 518, p. 7075-7080

    Research output: Contribution to journal › Article › Research › peer-review

  9. 2011
  10. Published

    Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications

    Galiana, B., Rey-Stolle, I., Beinik, I., Teichert, C., Algora, C., Molina-Aldareguia, J. M. & Tejedor, P., 2011, In: Solar energy materials and solar cells. 95, p. 1949-1954

    Research output: Contribution to journal › Article › Research › peer-review

  11. Published

    Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics

    Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

  12. Published

    Electrical Characterization of Semiconductor Nanostructures by Conductive Probe Based Atomic Force Microscopy Techniques

    Beinik, I., 2011, 118 p.

    Research output: Thesis › Doctoral Thesis

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