Gerhard Dehm
(Former)
Research output
- 2010
- Published
Investigation of the fatigue behavior of Al thin films with different microstructure
Dehm, G., Heinz, W. & Pippan, R., 2010, In: Materials science and engineering: A, Structural materials: properties, microstructure and processing. p. 7757-7763Research output: Contribution to journal › Article › Research › peer-review
- Published
KKKÖ Meeting
Dehm, G., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Laying the groundwork - The search for damage resistant materials
Dehm, G., 2010, In: Public service review: European science & technology : an independent reviewPublic Service Review. 5, p. 76-77Research output: Contribution to journal › Article › Research › peer-review
- Published
Micron-sized fracture experiments on amorphous SiOx films and SiOx/SiNx multi-layers
Matoy, K., Schönherr, H., Detzel, T. & Dehm, G., 2010, In: Thin solid films. 518, p. 5796-5801Research output: Contribution to journal › Article › Research › peer-review
- Published
Microplasticity phenomena in thermomechanically strained nickel thin films
Taylor, A., Oh, S. H. & Dehm, G., 2010, In: Journal of materials science. 45, p. 3874-3881Research output: Contribution to journal › Article › Research › peer-review
- Published
Stress, Sheet Resistance, and Microstructure Evolution of Electroplated Cu Films During Self-Annealing
Huang, R., Robl, W., Ceric, H., Detzel, T. & Dehm, G., 2010, In: IEEE transactions on device and materials reliability. 10, 1, p. 47-54Research output: Contribution to journal › Article › Research › peer-review
- Published
Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM
Cazottes, S., Zhang, Z. L., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films.Research output: Contribution to journal › Article › Research › peer-review
- Published
Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM
Cazottes, S., Zhang, Z., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films. 519, p. 1662-1667Research output: Contribution to journal › Article › Research › peer-review
- Published
Study of nanometer-scaled lamellar microstructure in a Ti-45Al-7.5Nb alloy-Experiments and modeling
Fischer, F. D., Waitz, T., Scheu, C., Cha, L., Dehm, G., Antretter, T. & Clemens, H., 2010, In: Intermetallics. 18, p. 509-517Research output: Contribution to journal › Article › Research › peer-review
- Published
Testing the Application of the Shear Lag Approximation to Thin Films on Cu and Polymer Substrates
Taylor, A., Cordill, M., Edlmayr, V., Raj, R. & Dehm, G., 2010.Research output: Contribution to conference › Poster › Research › peer-review
