Gerhard Dehm
(Former)
Research output
- Published
Thermal Stresses and Microstructure of Tungsten Films on Copper
Kapp, M., Martinschitz, K. J., Keckes, J., Lackner, J. M., Zizak, I. & Dehm, G., 2008, In: Berg- und hüttenmännische Monatshefte : BHM. 517, p. 273-277Research output: Contribution to journal › Article › Research › peer-review
- Published
Dynamical growth of Cu–Pt nanowires with a nanonecklace morphology
Inkson, B. J., Dehm, G. & Pen, Y., 2007, In: Nanotechnology. 18, p. 601-606Research output: Contribution to journal › Article › Research › peer-review
- Published
Deformation behavior of miniaturized copper bicrystals and corresponding dislocation boundary reactions
Imrich, P. J., Kirchlechner, C., An, X., Zhang, Z. & Dehm, G., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Internal and external stresses: In situ TEM compression of Cu bicrystals containing a twin boundary
Imrich, P. J., Kirchlechner, C., Kiener, D. & Dehm, G., 15 Apr 2015, In: Scripta materialia. 100, p. 94-97 4 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
In Situ TEM Microcompression of Single and Bicrystalline Samples: Insights and Limitations
Imrich, P. J., Kirchlechner, C., Kiener, D. & Dehm, G., 19 May 2015, In: JOM. 67, 8, p. 1704 1712 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Differences in deformation behavior of bicrystalline Cu micropillars containing a twin boundary or a large-angle grain boundary
Imrich, P., Kirchlechner, C., Motz, C. & Dehm, G., 2014, In: Acta materialia. 73, p. 240-250Research output: Contribution to journal › Article › Research › peer-review
- Published
Stress, Sheet Resistance, and Microstructure Evolution of Electroplated Cu Films During Self-Annealing
Huang, R., Robl, W., Ceric, H., Detzel, T. & Dehm, G., 2010, In: IEEE transactions on device and materials reliability. 10, 1, p. 47-54Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical properties and structure of grain boundaries in n-conducting BaTiO3 ceramics
Hou, J., Zhang, Z., Preis, W., Sitte, W. & Dehm, G., 2011, In: Journal of the European Ceramic Society. p. 763-771Research output: Contribution to journal › Article › Research › peer-review
- Published
TEM characterization of CrN thin films epitaxially grown on MgO (001)
Harzer, T. P., Kormout, K., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2012.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Transmission electron microscopy characterization of CrN films on MgO(001)
Harzer, T. P., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2013, In: Thin solid films. 545, p. 154-160 7 p.Research output: Contribution to journal › Article › Research › peer-review
