Design of multilayer metallization to reduce mechanical loading: Effect of growth conditions on interface stability and thermo-mechanical properties of sputtered Cu films on Si with and without WTi barrier layers

Publikationen: KonferenzbeitragVortragForschung

Details

OriginalspracheEnglisch
StatusVeröffentlicht - 2016
Veranstaltung8th International Conference On Technological Advances Of Thin Films and Surface Coatings - Singapur, Singapur
Dauer: 12 Juli 201615 Juli 2016

Konferenz

Konferenz8th International Conference On Technological Advances Of Thin Films and Surface Coatings
KurztitelThinFilms2016
Land/GebietSingapur
OrtSingapur
Zeitraum12/07/1615/07/16