Design of multilayer metallization to reduce mechanical loading: Effect of growth conditions on interface stability and thermo-mechanical properties of sputtered Cu films on Si with and without WTi barrier layers

Research output: Contribution to conferencePresentationResearch

Details

Original languageEnglish
Publication statusPublished - 2016
Event8th International Conference On Technological Advances Of Thin Films and Surface Coatings - Singapur, Singapore
Duration: 12 Jul 201615 Jul 2016

Conference

Conference8th International Conference On Technological Advances Of Thin Films and Surface Coatings
Abbreviated titleThinFilms2016
Country/TerritorySingapore
CitySingapur
Period12/07/1615/07/16