Molecular alignments in sexiphenyl thin films epitaxially grown on muscovite

Plank, H., Resel, R., Sitter, H., Andreev, A., Sariciftci, N. S., Hlawacek, G., Teichert, C., Thierry, A. & Lotz, B., 2003, in: Thin solid films. 443, S. 108-114

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Effect of wavelength modulation of arc evaporated Ti-Al-N/Ti-Al-V-N multilayer coatings on microstructure and mechanical/tribological properties

Pfeiler-Deutschmann, M., Mayrhofer, P. H., Chladil, K., Penoy, M., Michotte, C., Kathrein, M. & Mitterer, C., 1 Jan. 2015, in: Thin solid films. 581, S. 20-24 5 S.

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Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films

Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, in: Thin solid films. 518, S. 7075-7080

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Structure and properties of high power impulse magnetron sputtering and DC magnetron sputtering CrN and TiN films deposited in an industrial scale unit

Paulitsch, J., Schenkel, M., Zufraß, T., Mayrhofer, P. H. & Münz, W.-D., 2010, in: Thin solid films. 518, S. 5558-5564

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Low Friction CrN/TiN multilayer coatings prepared by a hybrid high power impulse magnetron sputtering/DC magnetron sputtering deposition technique

Paulitsch, J., Schenkel, M., Schintlmeister, A., Hutter, H. & Mayrhofer, P. H., 2010, in: Thin solid films. 518, S. 5553-5557

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Structure and mechanical properties of CrN/TiN multilayer coatings prepared by a combined HIPIMS/UBMS deposition technique

Paulitsch, J., Mayrhofer, P. H., Münz, W.-D. & Schenkel, M., 2008, in: Thin solid films. 517, S. 1239-1244

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Nanoindentation Response of High Performance Fullerene-Like CNx

Neidhardt, J., Palacio, J. F., Bull, S. J. & Hultman, L., 2006, in: Thin solid films. 494, S. 63-68

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Structure and properties of magnetron sputtered Zr-Si-N films with a high (≥25 at.%) Si content

Musil, J., Daniel, R., Zeman, P. & Takai, O., 2005, in: Thin solid films.

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Patterned immobilisation of silicon dioxide nanoparticles on the surface of a photosensitive polymer

Muhr, N., Kern, W. & Grießer, T., 2012, in: Thin solid films. 520, S. 1789-1793

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Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography

Mühlbacher, M., Mendez Martin, F., Sartory, B., Schalk, N., Keckes, J., Lu, J., Hultman, L. & Mitterer, C., 2015, in: Thin solid films. 574, S. 103-109

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