Jozef Keckes
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Research output
- 2004
- Published
Thermally-induced stresses in thin aluminum layers grown on silicon
Eiper, E., Resel, R., Eisenmenger-Sittner, C., Hafok, M. & Keckes, J., 2004, In: Powder diffraction. p. 74-76Research output: Contribution to journal › Article › Research › peer-review
