20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates

Research output: Contribution to journalArticleResearchpeer-review

External Organisational units

  • KAI – Kompetenzzentrum Automobil- und Industrieelektronik GmbH
  • Structure and Mechanics of Advanced Materials
  • Paul Scherrer Institut

Details

Original languageEnglish
Article number113664
JournalMaterials and Design
Volume251
DOIs
Publication statusPublished - Mar 2025