Thermally-induced stresses in thin aluminum layers grown on silicon

Research output: Contribution to journalArticleResearchpeer-review

Authors

  • Ernst Eiper
  • R. Resel
  • C. Eisenmenger-Sittner
  • M. Hafok
  • Jozef Keckes

Organisational units

Details

Translated title of the contributionThermally-induced stresses in thin aluminum layers grown on silicon
Original languageEnglish
Pages (from-to)74-76
JournalPowder diffraction
Publication statusPublished - 2004