Jozef Keckes

281 - 290 out of 318Page size: 10

Research output

  1. 2006
  2. Published

    Temperature dependence of residual stresses in thin films determined by the substrate

    Eiper, E., Martinschitz, K.-J., Köstenbauer, H., Massl, S. & Keckes, J., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  3. Published

    Temperature dependence of residual stresses in thin films determined by the substrate curvatur method

    Eiper, E., Martinschitz, K.-J., Köstenbauer, H., Massl, S. & Keckes, J., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    Texture changes in cyclically deformed cellulosics characterized by in-situ synchrotron diffraction coupled with tensile tests

    Martinschitz, K.-J., Boesecke, P., Gindl, W. & Keckes, J., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Zukunftsfonds Land Steiermark, Projekt Nr. 119

    Eiper, E., Keckes, J. & Pippan, R., 2006

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  6. 2005
  7. Published

    All-cellulose nanocomposite

    Gindl, W. & Keckes, J., 2005, In: Polymer. 46, p. 10221-10225

    Research output: Contribution to journal › Article › Research › peer-review

  8. Published

    Anisotropic intrinsic and extrinsic stresses in epitaxial wurzitic GaN thin film on γ-LiAlO2 (100)

    Eiper, E., Hofmann, A., Gerlach, J. W., Rauschenbach, B. & Keckes, J., 2005, In: Journal of crystal growth. 284, p. 561-566

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

    Eiper, E., Martinschitz, K.-J. & Keckes, J., 2005, In: Powder diffraction. 20, p. 1-5

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    Eigenspannungs-Charakterisierung mittels Röntgendiffraktometrie

    Keckes, J. & Eiper, E., 2005, Handbuch der Nanoanalytik. p. 147-149

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

  11. Published

    Hardness Limits of SiC and Si3N4 Ceramic Materials

    Balog, M., Sajgalík, P., Lencés, Z., Hnatko, M. & Keckes, J., 2005, Key engineering materials. Vol. 59. p. 247-251 (Key engineering materials).

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

  12. Published

    Hochtemperatur-Röntgendiffraktion - Spannungen und Deformationen in dünnen Aluminium-Schichten auf Silizium

    Resch, C., Keckes, J., Eiper, E. & Resel, E., 2005, Handbuch der Nanoanalytik. p. 170-172

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

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