Temperature dependence of residual stresses in thin films determined by the substrate curvatur method
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Translated title of the contribution | Temperature dependence of residual stresses in thin films determined by the substrate curvatur method |
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Original language | English |
Publication status | Published - 2006 |
Event | 7th European Conference Residual Stresses ECRS7 - Berlin, Germany Duration: 13 Sept 2006 → 15 Sept 2006 |
Conference
Conference | 7th European Conference Residual Stresses ECRS7 |
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Country/Territory | Germany |
City | Berlin |
Period | 13/09/06 → 15/09/06 |