Temperature dependence of residual stresses in thin films determined by the substrate curvatur method

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Translated title of the contributionTemperature dependence of residual stresses in thin films determined by the substrate curvatur method
Original languageEnglish
Publication statusPublished - 2006
Event7th European Conference Residual Stresses ECRS7 - Berlin, Germany
Duration: 13 Sept 200615 Sept 2006

Conference

Conference7th European Conference Residual Stresses ECRS7
Country/TerritoryGermany
CityBerlin
Period13/09/0615/09/06