Jozef Keckes
Research output
- 2015
- Published
Microstructure-controlled depth gradients of mechanical properties in thin nanocrystalline films: Towards structure-property gradient functionalization
Daniel, R., Zeilinger, A., Schöberl, T., Sartory, B., Mitterer, C. & Keckes, J., 2015, In: Journal of applied physics. 117, 23, p. 235301-1-235301-12Research output: Contribution to journal › Article › Research › peer-review
- Published
Pencil-beam X-ray nanodiffraction on CVD α-Al2O3 hard coatings with grain sizes in the micrometer range
Tkadletz, M., Keckes, J., Schalk, N., Czettl, C. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Recent progress in advanced characterization methods for the development of hard coatings: From improved composition/microstructure/property relations to insights in degradation behavior
Mitterer, C., Mühlbacher, M., Zeilinger, A., Stefenelli, M., Daniel, R., Tkadletz, M., Schalk, N., Sartory, B. & Keckes, J., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Residual stress gradients in alpha-Al2O3 hard coatings determined by pencil-beam X-ray nanodiffraction: The influence of blasting media
Tkadletz, M., Keckes, J., Schalk, N., Krajinovic, I., Burghammer, M., Czettl, C. & Mitterer, C., 2015, In: Surface & coatings technology. 262, p. 134-140 7 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Resolving depth evolution of microstructure and hardness in sputtered CrN film
Zeilinger, A., Daniel, R., Schöberl, T., Stefenelli, M., Sartory, B., Keckes, J. & Mitterer, C., 2015, In: Thin solid films. 581.2015, April, p. 75-79Research output: Contribution to journal › Article › Research › peer-review
- Published
Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films
Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.Research output: Contribution to conference › Poster › Research › peer-review
- Published
X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M. & Keckes, J., 2015, In: Acta materialia. 85, p. 24-31Research output: Contribution to journal › Article › Research › peer-review
- 2014
- Published
Mono-textured nanocrystalline thin films with pronounced stress-gradients: On the role of grain boundaries in the stress evolution
Daniel, R., Jäger, E., Todt, J., Sartory, B., Mitterer, C. & Keckes, J., 28 May 2014, In: Journal of applied physics. 115, 20, 203507.Research output: Contribution to journal › Article › Research › peer-review
- Published
Macroscopic fracture behaviour of CrN hard coatings evaluated by X-ray diffraction coupled with four-point bending
Stefenelli, M., Riedl, A., Todt, J., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 1 Jan 2014, Materials Science Forum. Vol. 768-769. p. 272-279 8 p. (Materials Science Forum; vol. 768-769).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
Riedl, A., Daniel, R., Todt, J., Steffenelli, M., Holec, D., Sartory, B., Krywka, C., Müller, M., Mitterer, C. & Keckes, J., 2014, In: Surface & coatings technology. 257, p. 108-113Research output: Contribution to journal › Article › Research › peer-review
