A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings

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Authors

Translated title of the contribution	A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
Original language	English
Pages (from-to)	108-113
Journal	Surface & coatings technology
Volume	257
DOIs	https://doi.org/10.1016/j.surfcoat.2014.03.045
Publication status	Published - 2014