A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings

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A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings. / Riedl, Angelika; Daniel, Rostislav; Todt, J. et al.
In: Surface & coatings technology, Vol. 257, 2014, p. 108-113.

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@article{a967ef86bc754d06abd5eb9fe3d355ec,
title = "A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings",
author = "Angelika Riedl and Rostislav Daniel and J. Todt and M. Steffenelli and David Holec and B. Sartory and C. Krywka and M. M{\"u}ller and Christian Mitterer and Jozef Keckes",
year = "2014",
doi = "10.1016/j.surfcoat.2014.03.045",
language = "English",
volume = "257",
pages = "108--113",
journal = "Surface & coatings technology",
issn = "0257-8972",
publisher = "Elsevier",

}

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TY - JOUR

T1 - A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings

AU - Riedl, Angelika

AU - Daniel, Rostislav

AU - Todt, J.

AU - Steffenelli, M.

AU - Holec, David

AU - Sartory, B.

AU - Krywka, C.

AU - Müller, M.

AU - Mitterer, Christian

AU - Keckes, Jozef

PY - 2014

Y1 - 2014

U2 - 10.1016/j.surfcoat.2014.03.045

DO - 10.1016/j.surfcoat.2014.03.045

M3 - Article

VL - 257

SP - 108

EP - 113

JO - Surface & coatings technology

JF - Surface & coatings technology

SN - 0257-8972

ER -