A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
Research output: Contribution to journal › Article › Research › peer-review
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A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings. / Riedl, Angelika; Daniel, Rostislav; Todt, J. et al.
In: Surface & coatings technology, Vol. 257, 2014, p. 108-113.
In: Surface & coatings technology, Vol. 257, 2014, p. 108-113.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Riedl, A, Daniel, R, Todt, J, Steffenelli, M, Holec, D, Sartory, B, Krywka, C, Müller, M, Mitterer, C & Keckes, J 2014, 'A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings', Surface & coatings technology, vol. 257, pp. 108-113. https://doi.org/10.1016/j.surfcoat.2014.03.045
APA
Riedl, A., Daniel, R., Todt, J., Steffenelli, M., Holec, D., Sartory, B., Krywka, C., Müller, M., Mitterer, C., & Keckes, J. (2014). A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings. Surface & coatings technology, 257, 108-113. https://doi.org/10.1016/j.surfcoat.2014.03.045
Vancouver
Riedl A, Daniel R, Todt J, Steffenelli M, Holec D, Sartory B et al. A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings. Surface & coatings technology. 2014;257:108-113. doi: 10.1016/j.surfcoat.2014.03.045
Author
Bibtex - Download
@article{a967ef86bc754d06abd5eb9fe3d355ec,
title = "A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings",
author = "Angelika Riedl and Rostislav Daniel and J. Todt and M. Steffenelli and David Holec and B. Sartory and C. Krywka and M. M{\"u}ller and Christian Mitterer and Jozef Keckes",
year = "2014",
doi = "10.1016/j.surfcoat.2014.03.045",
language = "English",
volume = "257",
pages = "108--113",
journal = "Surface & coatings technology",
issn = "0257-8972",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
AU - Riedl, Angelika
AU - Daniel, Rostislav
AU - Todt, J.
AU - Steffenelli, M.
AU - Holec, David
AU - Sartory, B.
AU - Krywka, C.
AU - Müller, M.
AU - Mitterer, Christian
AU - Keckes, Jozef
PY - 2014
Y1 - 2014
U2 - 10.1016/j.surfcoat.2014.03.045
DO - 10.1016/j.surfcoat.2014.03.045
M3 - Article
VL - 257
SP - 108
EP - 113
JO - Surface & coatings technology
JF - Surface & coatings technology
SN - 0257-8972
ER -
