X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

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Authors

Translated title of the contribution	X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Original language	English
Pages (from-to)	24-31
Journal	Acta materialia
Volume	85
DOIs	https://doi.org/10.1016/j.actamat.2014.11.011
Publication status	Published - 2015