X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Research output: Contribution to journal › Article › Research › peer-review
Standard
In: Acta materialia, Vol. 85, 2015, p. 24-31.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
APA
Vancouver
Author
Bibtex - Download
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
AU - Steffenelli, M.
AU - Daniel, Rostislav
AU - Ecker, W
AU - Kiener, Daniel
AU - Todt, Juraj
AU - Zeilinger, A.
AU - Mitterer, Christian
AU - Burghammer, M.
AU - Keckes, Jozef
PY - 2015
Y1 - 2015
U2 - 10.1016/j.actamat.2014.11.011
DO - 10.1016/j.actamat.2014.11.011
M3 - Article
VL - 85
SP - 24
EP - 31
JO - Acta materialia
JF - Acta materialia
SN - 1359-6454
ER -