Jozef Keckes
Research output
- Published
Microfibril angle in wood: characterisation using X-ray scattering and influence on mechanical properties
Keckes, J., Burgert, I., Lichtenegger, H., Reiterer, A., Stanzl-Tschegg, S. & Fratzl, P., 2004, Proceedings of COST Action E20, Wood Fibre Cell Wall Structure. p. 189-202Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
In-situ WAXS studies of structural changes in wood foils and individual wood cells during microtensile tests
Keckes, J., Burgert, I., Müller, M., Kölln, K., Roth, S. V., Hamilton, M., Burghammer, M., Stanzl-Tschegg, S. & Fratzl, P., 2004.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Simultaneous evaluation of elastic and thermal strains in thermally-cycled thin films
Keckes, J., 2004.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100)
Keckes, J., Hafok, M., Eiper, E., Hofer, A., Resel, R. & Eisenmenger-Sittner, C., 2004, In: Powder diffraction. 19, p. 367-371Research output: Contribution to journal › Article › Research › peer-review
- Published
Review: current international research into cellulose nanofibres and nanocomposites
Keckes, J., Eichhorn, S. J., Dufresne, A., Aranguren, M., Marcovich, N. E., Capadona, J. R., Rowan, S. J., Weder, C., Thielemans, W., Roman, M., Renneckar, S., Gindl, W., Veigel, S., Yano, H., Abe, K., Nogi, M. & Nakagaito, A. N., 2010, In: Journal of materials science. p. 1-33Research output: Contribution to journal › Article › Research › peer-review
- Published
30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiOx thin film
Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M. C., Mitterer, C., Niese, S. & Kubec, A., 2018, In: Acta materialia. 144, p. 862-873Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors
Karner, S., Blank, O., Rösch, M., Burghammer, M., Zalesak, J., Keckes, J. & Todt, J., 20 Jun 2022, (E-pub ahead of print) In: Materialia. 24.2022, August, 6 p., 101484.Research output: Contribution to journal › Article › Research › peer-review
- Published
Nanobeam electron diffraction strain mapping in monocrystalline silicon of modern trench power MOSFETs
Karner, S., Blank, O., Rösch, M., Zalesak, J., Keckes, J. & Gammer, C., 2022, In: Microelectronic engineering. 264.2022, 15 August, 111870.Research output: Contribution to journal › Article › Research › peer-review
- Published
Thermal Stresses and Microstructure of Tungsten Films on Copper
Kapp, M., Martinschitz, K. J., Keckes, J., Lackner, J. M., Zizak, I. & Dehm, G., 2008, In: Berg- und hüttenmännische Monatshefte : BHM. 517, p. 273-277Research output: Contribution to journal › Article › Research › peer-review
- Published
Experimental characterization and modelling of triaxial residual stresses in straightened railway rails
Kaiser, R., Stefenelli, M., Hatzenbichler, T., Antretter, T., Hofmann, M., Keckes, J. & Buchmayr, B., 2015, In: The Journal of Strain Analysis for Engineering Design. 50, 3, p. 190-198 9 p.Research output: Contribution to journal › Article › Research › peer-review
