30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiOx thin film
Research output: Contribution to journal › Article › Research › peer-review
Authors
Organisational units
External Organisational units
- Fraunhofer Institute for Material and Beam Technology (IWS)
- Fraunhofer IKTS
- ESRF
- AXO Dresden GmbH
- Materials Center Leoben Forschungs GmbH
- Erich Schmid Institute of Materials Science
Details
| Original language | English |
|---|---|
| Pages (from-to) | 862-873 |
| Journal | Acta materialia |
| Volume | 144 |
| DOIs | |
| Publication status | Published - 2018 |
