Jozef Keckes
Research output
- Published
Micromechanical Properties of Micro- and Nanocrystalline CVD Diamond Thin Films with Gradient Microstructures and Stresses
Meindlhumer, M., Ziegelwanger, T., Grau, J., Sternschulte, H., Sztucki, M., Steinmüller-Nethl, D. & Keckes, J., 12 Jan 2024, In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 42.2024, 2, 12 p., 023401.Research output: Contribution to journal › Article › Research › peer-review
- Published
Multimethod cross-sectional characterization approaching the limits of diamond monophase multilayers
Meindlhumer, M., Grau, J., Sternschulte, H., Halahovets, Y., Siffalovic, P., Burghammer, M., Steinmüller-Nethl, D. & Keckes, J., 13 May 2024, In: Materials characterization. 212.2024, June, 15 p., 113973.Research output: Contribution to journal › Article › Research › peer-review
- Published
Resolving the fundamentals of the J-integral concept by multi-method in situ nanoscale stress-strain mapping
Meindlhumer, M., Alfreider, M., Sheshi, N., Hohenwarter, A., Todt, J., Rosenthal, M., Burghammer, M., Salvati, E., Keckes, J. & Kiener, D., 22 Feb 2025, In: Communications materials. 2025, 6, 15 p., 35.Research output: Contribution to journal › Article › Research › peer-review
- Published
A new cantilever technique reveals spatial distributions of residual stresses in near-surface structures
Massl, S., Keckes, J. & Pippan, R., 2008, In: Scripta materialia. 59, p. 503-506Research output: Contribution to journal › Article › Research › peer-review
- Published
A cantilever method to determine depth profiles of residual stresses on the nanoscale
Massl, S., Keckes, J. & Pippan, R., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale
Massl, S., Keckes, J. & Pippan, R., 2007, In: Acta materialia. 55, p. 4835-4844Research output: Contribution to journal › Article › Research › peer-review
- Published
Stress measurement in thin films with the ion beam layer removal method: Influence of experimental errors and parameters
Massl, S., Köstenbauer, H., Keckes, J. & Pippan, R., 2008, In: Thin solid films. 516, p. 8655-8662Research output: Contribution to journal › Article › Research › peer-review
- Published
Investigation of fracture properties of magnetron-sputtered TiN films by means of a FIB-based cantilever bending technique
Massl, S., Thomma, W., Keckes, J. & Pippan, R., 2009, In: Acta materialia. 57, p. 1768-1776Research output: Contribution to journal › Article › Research › peer-review
- Published
A new tensile stage for in situ X-ray scattering experiments combined with mechanical tests
Martinschitz, K.-J., Eiper, E., Keckes, J., Boesecke, P., Schwarzl, P. & Hofbauer, P., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Cyclically deformed cellulose films characterized by in situ synchrotron diffraction coupled with tensile tests
Martinschitz, K.-J., Boesecke, P., Gindl, W. & Keckes, J., 2006.Research output: Contribution to conference › Poster › Research › peer-review
