Gerhard Dehm
(Former)
Research output
- Published
Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM
Cazottes, S., Zhang, Z., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films. 519, p. 1662-1667Research output: Contribution to journal › Article › Research › peer-review
- Published
Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM
Cazottes, S., Zhang, Z. L., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films.Research output: Contribution to journal › Article › Research › peer-review
- Published
Stress, Sheet Resistance, and Microstructure Evolution of Electroplated Cu Films During Self-Annealing
Huang, R., Robl, W., Ceric, H., Detzel, T. & Dehm, G., 2010, In: IEEE transactions on device and materials reliability. 10, 1, p. 47-54Research output: Contribution to journal › Article › Research › peer-review
- Published
Stress-controlled fatigue behaviour of micro-sized polycrystalline copper wires
Dehm, G., 2009, In: Materials science and engineering: A, Structural materials: properties, microstructure and processing. 515, p. 71-78Research output: Contribution to journal › Article › Research › peer-review
- Published
Strain energy effects on texture evolution in thin films: biaxial vs. uniaxial stress state
Sonnweber-Ribic, P., Dehm, G., Gruber, P. & Arzt, E., 2006, Proceedings of the Amereican Institute of Physics Conference "Stress-Induced Phenomena in Metallization". p. 192-197Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Strain Compensation by Twinning in Au Thin Films: Experimental and Model
Dehm, G., Oh, S. H., Gruber, P., Legros, M. & Fischer, F. D., 2007, In: Acta materialia. 55, p. 6659-6665Research output: Contribution to journal › Article › Research › peer-review
- Published
Size-Induced Transition from Perfect to Partial Dislocation Plasticity in Single Crystal Au Films on Polyimide
Oh, S. H., Legros, M., Kiener, D., Gruber, P. A. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 278-279Research output: Contribution to journal › Article › Research › peer-review
- Published
Size-independent stresses in Al thin films thermally strained down to -100°C
Eiper, E., Keckes, J., Zizak, I., Cabie, M. & Dehm, G., 2007, In: Acta materialia. 55, p. 1941-1946Research output: Contribution to journal › Article › Research › peer-review
- Published
Size effect in metallic thin films characterized by low-temperature X-ray diffraction
Eiper, E., Martinschitz, K. J., Dehm, G. & Keckes, J., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Size effect in metallic thin films characterized by low-temperature X-ray diffraction
Eiper, E., Martinschitz, K. J., Dehm, G. & Keckes, J., 2006.Research output: Contribution to conference › Poster › Research › peer-review