Size effect in metallic thin films characterized by low-temperature X-ray diffraction
Research output: Contribution to conference › Poster › Research › peer-review
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| Translated title of the contribution | Size effect in metallic thin films characterized by low-temperature X-ray diffraction |
|---|---|
| Original language | English |
| Publication status | Published - 2006 |
| Event | 55th Annual Denver X-ray Conference - Denver, United States Duration: 7 Aug 2006 → 11 Aug 2006 |
Conference
| Conference | 55th Annual Denver X-ray Conference |
|---|---|
| Country/Territory | United States |
| City | Denver |
| Period | 7/08/06 → 11/08/06 |
