Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Research output: Contribution to conference › Poster › Research › peer-review

Size effect in metallic thin films characterized by low-temperature X-ray diffraction. / Eiper, Ernst; Martinschitz, Klaus Jürgen; Dehm, Gerhard et al.
2006. Poster session presented at 55th Annual Denver X-ray Conference, Denver, Colorado, United States.

Research output: Contribution to conference › Poster › Research › peer-review

Eiper, E, Martinschitz, KJ, Dehm, G & Keckes, J 2006, 'Size effect in metallic thin films characterized by low-temperature X-ray diffraction', 55th Annual Denver X-ray Conference, Denver, United States, 7/08/06 - 11/08/06.

Eiper, E., Martinschitz, K. J., Dehm, G., & Keckes, J. (2006). Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Poster session presented at 55th Annual Denver X-ray Conference, Denver, Colorado, United States.

Eiper E, Martinschitz KJ, Dehm G , Keckes J. Size effect in metallic thin films characterized by low-temperature X-ray diffraction. 2006. Poster session presented at 55th Annual Denver X-ray Conference, Denver, Colorado, United States.

Eiper, Ernst ; Martinschitz, Klaus Jürgen ; Dehm, Gerhard et al. / Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Poster session presented at 55th Annual Denver X-ray Conference, Denver, Colorado, United States.

@conference{44982903b085460c804c4c43db421f5b,

title = "Size effect in metallic thin films characterized by low-temperature X-ray diffraction",

author = "Ernst Eiper and Martinschitz, {Klaus J{\"u}rgen} and Gerhard Dehm and Jozef Keckes",

year = "2006",

language = "English",

note = "55th Annual Denver X-ray Conference ; Conference date: 07-08-2006 Through 11-08-2006",

}

TY - CONF

T1 - Size effect in metallic thin films characterized by low-temperature X-ray diffraction

AU - Eiper, Ernst

AU - Martinschitz, Klaus Jürgen

AU - Dehm, Gerhard

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

M3 - Poster

T2 - 55th Annual Denver X-ray Conference

Y2 - 7 August 2006 through 11 August 2006

ER -

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