Gerhard Dehm
(Former)
Research output
- Published
Sekundärionen-Massensprektroskopie (SIMS) mittels FIB
Motz, C., Kiener, D., Schöberl, T., Pippan, R. & Dehm, G., 2005, Handbuch der Nanoanalytik. p. 199-200Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik
Motz, C., Kiener, D., Schöberl, T., Pippan, R. & Dehm, G., 2005, Handbuch der Nanoanalytik. p. 162-163Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Micron beam bending and compression tests - micromechanical properties of copper
Motz, C., Kiener, D., Schöberl, T. & Dehm, G., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testing
Moser, G., Felber, H., Rashkova, B., Imrich, P. J., Kirchlechner, C., Grosinger, W., Motz, C., Dehm, G. & Kiener, D., 2012, In: Practical metallography = Praktische Metallographie. 49, p. 343-355Research output: Contribution to journal › Article › Research › peer-review
- Published
Micron-sized fracture experiments on amorphous SiOx films and SiOx/SiNx multi-layers
Matoy, K., Schönherr, H., Detzel, T. & Dehm, G., 2010, In: Thin solid films. 518, p. 5796-5801Research output: Contribution to journal › Article › Research › peer-review
- Published
Interface fracture properties of thin films studied by using the micro-cantilever deflection technique
Matoy, K., Detzel, T., Müller, M., Motz, C. & Dehm, G., 2009, In: Surface & coatings technology. 204, p. 878-881Research output: Contribution to journal › Article › Research › peer-review
- Published
A comparative micro-cantilever study of the mechanical behavior of silicon based passivation films
Matoy, K., Schönherr, H., Detzel, T., Schöberl, T., Pippan, R., Motz, C. & Dehm, G., 2009, In: Thin solid films. 518, p. 247-256Research output: Contribution to journal › Article › Research › peer-review
- Published
In-situ fracture study of thin Cu films on polyimide substrate
Marx, V. M., Kirchlechner, C., Zizak, I., Dehm, G. & Cordill, M. J., 2012.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Untersuchungsbericht Rohrprobe DOW-weiss
Maier, G. & Dehm, G., 2005Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Untersuchungsbericht Rohrproben Haager
Maier, G. & Dehm, G., 2005Research output: Book/Report › Commissioned report › Transfer › peer-review
