Gerhard Dehm

(Former)

121 - 130 out of 175Page size: 10

Research output

  1. 2010
  2. Published

    In situ μLaue tensile tests on micron sized Cu single crystals

    Kirchlechner, C., Imrich, P., Grosinger, W., Kapp, M., Motz, C., Keckes, J. & Dehm, G., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  3. Published

    Investigation of the fatigue behavior of Al thin films with different microstructure

    Dehm, G., Heinz, W. & Pippan, R., 2010, In: Materials science and engineering: A, Structural materials: properties, microstructure and processing. p. 7757-7763

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    KKKÖ Meeting

    Dehm, G., 2010

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  5. Published

    Laying the groundwork - The search for damage resistant materials

    Dehm, G., 2010, In: Public service review: European science & technology : an independent reviewPublic Service Review. 5, p. 76-77

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    Micron-sized fracture experiments on amorphous SiOx films and SiOx/SiNx multi-layers

    Matoy, K., Schönherr, H., Detzel, T. & Dehm, G., 2010, In: Thin solid films. 518, p. 5796-5801

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    Microplasticity phenomena in thermomechanically strained nickel thin films

    Taylor, A., Oh, S. H. & Dehm, G., 2010, In: Journal of materials science. 45, p. 3874-3881

    Research output: Contribution to journal › Article › Research › peer-review

  8. Published

    Stress, Sheet Resistance, and Microstructure Evolution of Electroplated Cu Films During Self-Annealing

    Huang, R., Robl, W., Ceric, H., Detzel, T. & Dehm, G., 2010, In: IEEE transactions on device and materials reliability. 10, 1, p. 47-54

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM

    Cazottes, S., Zhang, Z. L., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films.

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM

    Cazottes, S., Zhang, Z., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films. 519, p. 1662-1667

    Research output: Contribution to journal › Article › Research › peer-review

  11. Published

    Study of nanometer-scaled lamellar microstructure in a Ti-45Al-7.5Nb alloy-Experiments and modeling

    Fischer, F. D., Waitz, T., Scheu, C., Cha, L., Dehm, G., Antretter, T. & Clemens, H., 2010, In: Intermetallics. 18, p. 509-517

    Research output: Contribution to journal › Article › Research › peer-review

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