Recent developments in surface science and engineering, thin films, nanoscience, biomaterials, plasma science, and vacuum technology

Mozetic, M., Vesel, A., Primc, G., Eisenmenger-Sittner, C., Bauer, J., Eder, A., Schmid, G. H. S., Ruzic, D. N., Ahmed, Z., Barker, D., Douglass, K. O., Eckel, S., Fedchak, J. A., Hendricks, J., Klimov, N., Ricker, J., Scherschligt, J., Stone, J., Strouse, G. & Capan, I. & 31 others, Buljan, M., Milosevic, S., Teichert, C., Cohen, S. R., Silva, A. G., Lehocky, M., Humpolicek, P., Rodriguez, C., Hernandez-Montelongo, J., Mercier, D., Manso-Silvan, M., Ceccone, G., Galtayries, A., Stana-Kleinschek, K., Petrov, I., Greene, J. E., Avila, J., Chen, C. Y., Caja-Munoz, B., Yi, H., Boury, A., Lorcy, S., Asensio, M. C., Bredin, J., Gans, T., O'Connell, D., Brendin, J., Reniers, F., Vincze, A., Anderle, M. & Montelius, L., 30 Aug 2018, In: Thin solid films. 660, p. 120-160

Research output: Contribution to journal › Review article › peer-review

Micron-sized fracture experiments on amorphous SiOx films and SiOx/SiNx multi-layers

Matoy, K., Schönherr, H., Detzel, T. & Dehm, G., 2010, In: Thin solid films. 518, p. 5796-5801

Research output: Contribution to journal › Article › Research › peer-review

A comparative micro-cantilever study of the mechanical behavior of silicon based passivation films

Matoy, K., Schönherr, H., Detzel, T., Schöberl, T., Pippan, R., Motz, C. & Dehm, G., 2009, In: Thin solid films. 518, p. 247-256

Research output: Contribution to journal › Article › Research › peer-review

Stress measurement in thin films with the ion beam layer removal method: Influence of experimental errors and parameters

Massl, S., Köstenbauer, H., Keckes, J. & Pippan, R., 2008, In: Thin solid films. 516, p. 8655-8662

Research output: Contribution to journal › Article › Research › peer-review

Effect of annealing on the size dependent deformation behavior of thin cobalt films on flexible substrates

Marx, V. M., Cordill, M., Többens, D., Kirchlechner, C. & Dehm, G., 10 Jan 2017, (E-pub ahead of print) In: Thin solid films. 624.2017, 28 February, p. 34-40 7 p.

Research output: Contribution to journal › Article › Research › peer-review

Stress evolution in CrN/Cr coating systems during thermal straining

Martinschitz, K. J., Daniel, R., Mitterer, C. & Keckes, J., 2008, In: Thin solid films. 516, p. 1972-1976

Research output: Contribution to journal › Article › Research › peer-review

Ion-assisted MBE for misfit-dislocation templates serving ordered growth of SiGe islands

Lyutovich, K., Oehme, M., Werner, J., Bahouchi, B., Kasper, E., Hofer, C. & Teichert, C., 2008, In: Thin solid films. 517, p. 20-22

Research output: Contribution to journal › Article › Research › peer-review

Effects of bias pulse frequencies on reactively sputter deposited NbO_x films

Lorenz, R., O`Sullivan, M., Fian, A., Sprenger, D., Lang, B. & Mitterer, C., 2018, In: Thin solid films. p. 335-342

Research output: Contribution to journal › Article › Research › peer-review

Interface structure of epitaxial (111) VN films on (111) MgO substrates

Lazar, P., Rashkova, B., Redinger, J., Podloucky, R., Mitterer, C., Scheu, C. & Dehm, G., 2008, In: Thin solid films. 517, p. 1177-1181

Research output: Contribution to journal › Article › Research › peer-review

Self-assembling (nano-)wrinkling topography formation in low-temperature vacuum deposition on soft polymer surfaces

Lackner, J., Waldhauser, W., Hartmann, P., Miskovics, O., Schmied, F., Teichert, C. & Schöberl, T., 2012, In: Thin solid films. 520, p. 2833-2840

Research output: Contribution to journal › Article › Research › peer-review