Thin solid films, 0040-6090
Journal
ISSNs | 0040-6090 |
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Research output
- Published
Resolving depth evolution of microstructure and hardness in sputtered CrN film
Zeilinger, A., Daniel, R., Schöberl, T., Stefenelli, M., Sartory, B., Keckes, J. & Mitterer, C., 2015, In: Thin solid films. 581.2015, April, p. 75-79Research output: Contribution to journal › Article › Research › peer-review
- Published
Epitaxial growth of Al-Cr-N thin films on MgO (111)
Willmann, H., Beckers, M., Birch, J., Mayrhofer, P. H., Mitterer, C. & Hultman, L., 2008, In: Thin solid films. p. 598-602Research output: Contribution to journal › Article › Research › peer-review
- Published
Structure and properties of sputter deposited crystalline and amorphous Cu-Ti films
Turnow, H., Wendrock, H., Menzel, S., Gemming, T. & Eckert, J., 1 Jan 2016, In: Thin solid films. 598, p. 184-188 5 p.Research output: Contribution to journal › Article › Research › peer-review
Synthesis and characterisation of high-entropy alloy thin films as candidates for coating nuclear fuel cladding alloys
Tunes, M. A., Vishnyakov, V. M. & Donnelly, S. E., 6 Mar 2018, (E-pub ahead of print) In: Thin solid films. 649.2018, 1 March, p. 115-120 6 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Influence of Al and Si content on structure and mechanical properties of arc evaporated Al-Cr-Si-N thin films
Tritremmel, C., Daniel, R., Lechthaler, M., Pocik, P. & Mitterer, C., 2013, In: Thin solid films. 534, p. 403-409Research output: Contribution to journal › Article › Research › peer-review
- Published
Microstructure and physical properties of sputter-deposited Cu-Mo thin films
Souli, I., Terziyska, V., Zechner, J. & Mitterer, C., 2018, In: Thin solid films. p. 301-308Research output: Contribution to journal › Article › Research › peer-review
- Published
Mechanical properties of homogeneous and nitrogen graded TiN thin films
Silva, F. C., Tunes, M. A., Sagás, J. C., Fontana, L. C., de Lima, N. B. & Schön, C. G., 30 Sept 2020, In: Thin solid films. 710, p. 138268 1 p., 138268.Research output: Contribution to journal › Article › Research › peer-review
- Published
Critical assessment of the determination of residual stress profiles in thin films by means of the ion beam layer removal method
Schöngrundner, R., Treml, R., Antretter, T., Kozic, D., Ecker, W. & Kiener, D., 2014, In: Thin solid films. p. 321-330Research output: Contribution to journal › Article › Research › peer-review
- Published
Influence of CrN and AlN layer thicknesses on structure and mechanical properties of CrN/AlN superlattices
Schlögl, M., Mayer, B., Paulitsch, J. & Mayrhofer, P., 2013, In: Thin solid films. 545, p. 375-379Research output: Contribution to journal › Article › Research › peer-review
- Published
Influence of AlN layers on mechanical properties and thermal stability of Cr-based nitride coatings
Schlögl, M., Paulitsch, J., Keckes, J. & Mayrhofer, P. H., 2013, In: Thin solid films. 531, p. 113-118Research output: Contribution to journal › Article › Research › peer-review