Cu diffusion in single-crystal and polycrystalline TiN barrier layers: A high-resolution experimental study supported by first-principles calculations

Mühlbacher, M., Bochkarev, A. S., Mendez Martin, F., Sartory, B., Chitu, L., Popov, M., Puschnig, P., Spitaler, J., Ding, H., Schalk, N., Lu, J., Hultman, L. & Mitterer, C., 26 Aug. 2015, (Elektronische Veröffentlichung vor Drucklegung.) in: Journal of applied physics. 118.2015, 8, 085307.

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Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film

Bartosik, M., Daniel, R., Mitterer, C., Matko, I., Burghammer, M., Mayrhofer, P. H. & Keckes, J., 2013, in: Thin solid films. 542, S. 1-4

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Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

Zalesak, J., Bartosik, M., Daniel, R., Mitterer, C., Krywka, C., Kiener, D., Mayrhofer, P. H. & Keckes, J., 2016, in: Acta materialia. 102, S. 212-219 8 S.

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Cross-sectional stress distribution in AlxGa1-xN heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction

Reisinger, M., Zalesak, J., Daniel, R., Tomberger, M., Weiss, J. K., Darbal, A. D., Petrenec, M., Zechner, J., Daumiller, I., Ecker, W., Sartory, B. & Keckes, J., 2016, in: Materials and Design. 106, S. 476-481 6 S.

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Cross-sectional gradients of residual stresses, microstructure and phases in a nitrided steel revealed by 20 µm synchrotron X-ray diffraction

Bodner, S. C., Ziegelwanger, T., Meindlhumer, M., Holcova, J., Todt, J., Schell, N. & Keckes, J., Okt. 2019, in: Metallurgia Italiana. 2019, 10, S. 7-11 5 S.

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Cross-sectional characterization techniques as the basis for knowledge-based design of graded CVD TiN-TiB₂ coatings

Tkadletz, M., Schalk, N., Mitterer, C., Keckes, J., Pohler, M. & Czettl, C., 2018, in: International journal of refractory metals & hard materials. 71, S. 280-284

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