Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations
Research output: Contribution to conference › Presentation › Research › peer-review
Standard
Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations. / Bigl, Stephan; Wurster, Stefan; Schöberl, Thomas et al.
2016. ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, United States.
2016. ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, United States.
Research output: Contribution to conference › Presentation › Research › peer-review
Harvard
Bigl, S, Wurster, S, Schöberl, T, Cordill, M & Kiener, D 2016, 'Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations', ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, United States, 25/04/16 - 29/04/16.
APA
Bigl, S., Wurster, S., Schöberl, T., Cordill, M., & Kiener, D. (2016). Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations. ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, United States.
Vancouver
Bigl S, Wurster S, Schöberl T, Cordill M, Kiener D. Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations. 2016. ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, United States.
Author
Bibtex - Download
@conference{34903b5af5c64b43afeb2b051e0f869a,
title = "Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations",
author = "Stephan Bigl and Stefan Wurster and Thomas Sch{\"o}berl and Megan Cordill and Daniel Kiener",
year = "2016",
language = "English",
note = "ICMCTF International Conference on Metal Coatings and Thin Films 2016 ; Conference date: 25-04-2016 Through 29-04-2016",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations
AU - Bigl, Stephan
AU - Wurster, Stefan
AU - Schöberl, Thomas
AU - Cordill, Megan
AU - Kiener, Daniel
PY - 2016
Y1 - 2016
M3 - Presentation
T2 - ICMCTF International Conference on Metal Coatings and Thin Films 2016
Y2 - 25 April 2016 through 29 April 2016
ER -
