Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations
Publikationen: Konferenzbeitrag › Vortrag › Forschung › (peer-reviewed)
Standard
Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations. / Bigl, Stephan; Wurster, Stefan; Schöberl, Thomas et al.
2016. ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, USA / Vereinigte Staaten.
2016. ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, USA / Vereinigte Staaten.
Publikationen: Konferenzbeitrag › Vortrag › Forschung › (peer-reviewed)
Harvard
Bigl, S, Wurster, S, Schöberl, T, Cordill, M & Kiener, D 2016, 'Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations', ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, USA / Vereinigte Staaten, 25/04/16 - 29/04/16.
APA
Bigl, S., Wurster, S., Schöberl, T., Cordill, M., & Kiener, D. (2016). Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations. ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, USA / Vereinigte Staaten.
Vancouver
Bigl S, Wurster S, Schöberl T, Cordill M, Kiener D. Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations. 2016. ICMCTF International Conference on Metal Coatings and Thin Films 2016, San Diego, USA / Vereinigte Staaten.
Author
Bibtex - Download
@conference{34903b5af5c64b43afeb2b051e0f869a,
title = "Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations",
author = "Stephan Bigl and Stefan Wurster and Thomas Sch{\"o}berl and Megan Cordill and Daniel Kiener",
year = "2016",
language = "English",
note = "ICMCTF International Conference on Metal Coatings and Thin Films 2016 ; Conference date: 25-04-2016 Through 29-04-2016",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Advanced Characterization of thermo-mechanical fatigue mechanisms for semiconductor metallizations
AU - Bigl, Stephan
AU - Wurster, Stefan
AU - Schöberl, Thomas
AU - Cordill, Megan
AU - Kiener, Daniel
PY - 2016
Y1 - 2016
M3 - Presentation
T2 - ICMCTF International Conference on Metal Coatings and Thin Films 2016
Y2 - 25 April 2016 through 29 April 2016
ER -
