Rostislav Daniel

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Research output

  1. Published

    X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

    Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M. & Keckes, J., 2015, In: Acta materialia. 85, p. 24-31

    Research output: Contribution to journal › Article › Research › peer-review

  2. Published

    X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

    Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

    Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel

    Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777

    Research output: Contribution to journal › Article › Research › peer-review

  5. Published

    X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

    Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films

    Kusiak, A., Martan, J., Battaglia, J.-L. & Daniel, R., 2013, In: Thermochimica Acta. 556, p. 1-5

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    Transmission electron microscopy characterization of CrN films on MgO(001)

    Harzer, T. P., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2013, In: Thin solid films. 545, p. 154-160 7 p.

    Research output: Contribution to journal › Article › Research › peer-review

  8. Published

    Thermal Stability of Sputtered W-Si-N Coatings

    Fadenberger, K., Rebholz, C., Baker, M. A., Daniel, R., Musil, J., Mayrhofer, P. H. & Mitterer, C., 2007, 34 th International Conference on Metallurgical Coatings and Thin Films. p. 36-36

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  9. Published

    Thermal stability of magnetron sputtered Zr–Si–N films

    Daniel, R., Musil, J., Zeman, P. & Mitterer, C., 2006, In: Surface & coatings technology. 201, p. 3368-3376

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    Thermally treated hard coatings characterized by XRD coupled with four-point bending

    Steffenelli, M., Riedl, A., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2012.

    Research output: Contribution to conference › Poster › Research › peer-review

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